The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Feb. 25, 2020
Applicant:

Marvell Asia Pte Ltd.;

Inventors:

Avi Haimzon, Nes Ziona, IL;

Ruven Torok, Cholon, IL;

Assignee:

Marvell Asia Pte, Ltd., Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/319 (2006.01); G01R 1/067 (2006.01); G01R 13/02 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 1/06766 (2013.01); G01R 13/0254 (2013.01); G01R 31/2889 (2013.01); G01R 31/31903 (2013.01);
Abstract

Methods and systems for collecting operational data from a target digital system are disclosed. In some embodiments, a method includes determining a test configuration to be used to configure a probe circuit. Determining the test configuration may include selecting one or more signal sources, defining one or more signal patterns within the selected signal sources, and defining one or more trigger events associated with the one or more signal patterns. Based on the test configuration, the probe circuit selects input/output (I/O) channels for a test cycle and captures one or more traces from the selected I/O channels during the test cycle.


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