The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Dec. 23, 2020
Applicant:

Isc Co., Ltd., Seongnam-si, KR;

Inventor:

Young Bae Chung, Seongnam-si, KR;

Assignee:

ISC CO., LTD., Seongnam-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06755 (2013.01); G01R 1/0408 (2013.01); G01R 1/06722 (2013.01); G01R 1/06738 (2013.01);
Abstract

The disclosure includes a contact device for electrical test, the contact device for electrical test including a second body portion, a first body portion stacked above the second body portion, a middle portion stacked above the first body portion, and having a first protrusion that is sharp and has a first apex portion, the first protrusion being formed on an upper side of the middle portion, and the first body portion, the middle portion, and the contact portion are sequentially and upwardly stacked, the middle portion and the contact portion include materials different from each other, and a first protrusion is provided inside the second protrusion.


Find Patent Forward Citations

Chung, Young. (2022). Contact device for electrical test (U.S. Patent No. 11442079). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11442079

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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