The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Aug. 30, 2018
Applicants:

De.tec.tor. S.r.l., Turin, IT;

Acciaierie Valbruna S.p.a., Vicenza, IT;

Inventors:

Giuseppe Pitta′, Turin, IT;

Massimo Amenduni, Vicenza, IT;

Mauro Zona, Turin, IT;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01); G01N 33/202 (2019.01); G01B 9/02 (2022.01); G01B 11/06 (2006.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); G01B 9/02 (2013.01); G01B 11/0608 (2013.01); G01N 33/202 (2019.01); G01N 2223/076 (2013.01); G01N 2223/3308 (2013.01); G01N 2223/507 (2013.01); G01N 2223/624 (2013.01); G01N 2223/643 (2013.01);
Abstract

An apparatus for selecting products on the basis of their composition via X-ray fluorescence spectroscopy includes an X-ray source that emits an X-ray beam towards a product sample, and a particle detector for receiving an X-ray beam diffused by the product sample and generating a signal received that can be analysed to determine a chemical composition of the product sample and selecting a type of product corresponding to said chemical composition of the product sample. The apparatus includes a first vacuum chamber located between an output of the apparatus facing the product sample and the X-ray source, and a second vacuum chamber located between the output of the apparatus facing the product sample and the detector. The apparatus also includes an optical module with polycapillary lens located downstream of the X-ray source, which is configured for focusing the X-ray beam and is associated in a vacuum-tight way to the first vacuum chamber.


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