The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Jan. 23, 2019
Applicant:

Molecular Devices (Gmbh) Austria, Hallstein, AT;

Inventors:

Andreas Gfroerer, Hallein, AT;

Frank Keidel, Hallein, AT;

Bernhard Schinwald, Hallein, AT;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G01N 21/6452 (2013.01);
Abstract

A system () for imaging microscopic samples comprises a light source () for exciting fluorescence from at least one sample, a photosensor () configured to detect light deflected by a beam splitter () from an optical excitation path directed to the sample and output an electrical signal of optical flux to the sample, a camera () configured to receive and form an image of fluorescence light emitted from the sample, and a controller () comprising an integrator () configured to integrate the electrical signal from the photodetector and a comparator configured to compare the integrated output to a predetermined threshold, wherein the controller is configured to control an exposure time of the camera such that each sample receives substantially the same total optical flux of incident light during a duration of camera exposure which is terminated when a predetermined threshold representative of the total optical flux is met.


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