The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Jul. 10, 2019
Applicant:

Sugentech, Inc., Daejeon, KR;

Inventors:

Sungrak Kim, Daejeon, KR;

Huije Lee, Daejeon, KR;

Hosung Sohn, Daejeon, KR;

Seungbum Yoo, Daejeon, KR;

Mi-Jin Sohn, Daejeon, KR;

Assignee:

SUGENTECH, INC., Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/64 (2013.01); G01J 3/4406 (2013.01);
Abstract

A fluorescent standard strip, according to the present invention, is for testing the reliability of the fluorescence intensity of a fluorescent strip used for an analyzer, the fluorescent standard strip having an effect whereby, for devices using a fluorescent substance, the inter-device deviation in fluorescence intensity is reduced, fluorescent signal linearity per fluorescent concentration level is secured, and device reliability may be tested by periodically checking faults, errors, deviations, etc. of the devices. In addition, the fluorescent standard strip, according to the present invention, has an effect whereby, even in an environment and state where light is frequently irradiated, the reduction of fluorescence intensity according to time may be minimized, i.e., the same level of fluorescence intensity may be maintained for a long period.


Find Patent Forward Citations

Loading…