The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2022
Filed:
Apr. 30, 2018
Dow Global Technologies Llc, Midland, MI (US);
Rohm and Haas Company, Collegeville, PA (US);
Donald L. McCarty, II, Midland, MI (US);
Erick Sutanto, Collegeville, PA (US);
John Lund, Midland, MI (US);
Brayden E. Glad, Lake Jackson, TX (US);
Hitendra Singh, Lake Jackson, TX (US);
Dow Global Technologies LLC, Midland, MI (US);
Rohm and Haas Company, Collegeville, PA (US);
Abstract
A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; a dart testing system configured to test a physical characteristic of the film sample; and a moving system configured to move the held film sample to be analyzed or tested between stations. The moving system is configured to move the held film sample in the material holder system to the dart testing system.