The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2022
Filed:
Apr. 30, 2018
Dow Global Technologies Llc, Midland, MI (US);
Sanjay C. Solanki, Midland, MI (US);
Donald L. McCarty, II, Midland, MI (US);
Robert A. Gunther, Midland, MI (US);
Jin Wang, Midland, MI (US);
Kyle A. Myers, Midland, MI (US);
Margaret C. Hayes, Midland, MI (US);
Dow Global Technologies LLC, Midland, MI (US);
Abstract
A system and method for performing a tear test are described herein. The system may include a fixed clamping station configured to hold a first portion of a film specimen and a movable clamp coupled to an actuator, the movable clamp may be configured to hold a second portion of the film specimen. The movable clamp may be configured to move in a direction away from the fixed clamping station to tear the film specimen. The system may include a slitter blade configured to cut the film specimen at a location between the fixed clamping station and the movable clamp. The system may include a load cell coupled to one of the fixed clamping station and the movable clamp. The load cell may be configured to measure a force associated with tearing of the film specimen. The actuator may be configured to manipulate the movable clamp along a trajectory.