The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Apr. 04, 2018
Applicant:

Ntn Corporation, Osaka, JP;

Inventors:

Wataru Hatakeyama, Kuwana, JP;

Makoto Miyazaki, Kuwana, JP;

Takashi Haseba, Kuwana, JP;

Yosuke Suzuki, Kuwana, JP;

Assignee:

NTN CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01H 1/00 (2006.01); G01M 13/028 (2019.01); G01P 7/00 (2006.01); G01H 3/08 (2006.01);
U.S. Cl.
CPC ...
G01H 1/003 (2013.01); G01H 3/08 (2013.01); G01M 13/028 (2013.01); G01P 7/00 (2013.01); F05B 2270/334 (2013.01);
Abstract

A data processing device includes a peak detector that detects a peak from a frequency spectrum and a map generator that generates an abnormality map for the frequency spectrum. The abnormality map includes as abnormal components, a frequency of a detected peak of interest and a frequency of a peak that appears together with the peak of interest when the peak of interest is assumed as the peak originating from abnormality. The data processing device includes an abnormal peak extractor that extracts as an abnormal peak, a peak at a frequency that matches with any of the abnormal components included in the abnormality map and a first criterion value calculator that calculates a first criterion value representing occurrence of abnormality corresponding to the abnormality map based on a spectral density of the abnormal peak.


Find Patent Forward Citations

Hatakeyama, Wataru. (2022). Condition monitoring apparatus, condition monitoring system, and condition monitoring method (U.S. Patent No. 11441940). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11441940

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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