The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Mar. 02, 2018
Applicant:

Robert Bosch Gmbh, Stuttgart, DE;

Inventors:

Roland Gauch, Renningen, DE;

Dmitriy Mikhaylov, Renningen, DE;

Tobias Graf, Stuttgart, DE;

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/06 (2014.01); B23K 26/067 (2006.01); B23K 26/0622 (2014.01); B23K 26/064 (2014.01); B23K 26/073 (2006.01); G02B 27/09 (2006.01); G02B 27/28 (2006.01); G02B 27/48 (2006.01);
U.S. Cl.
CPC ...
B23K 26/06 (2013.01); B23K 26/064 (2015.10); B23K 26/0622 (2015.10); B23K 26/0626 (2013.01); B23K 26/0673 (2013.01); B23K 26/073 (2013.01); G02B 27/0944 (2013.01); G02B 27/283 (2013.01); G02B 27/48 (2013.01);
Abstract

A method and a laser assemblage are described for material processing, such that in a laser assemblage, a laser beam is focused onto a processing/imaging plane and the laser beam can be adapted in terms of its intensity distribution by way of at least one beam shaper. Provision is made in this context that in order to avoid uniformity defects in the processing/imaging plane, the laser beam is split by way of at least one beam splitter into at least two partial or individual beams, and the partial or individual beams are differently influenced, or each partial or individual beam is constituted from a laser source having a different wavelength, in such a way that after they are combined and focused onto the processing/imaging plane they form an output beam having an intensity profile, adjacent intensity maxima of the intensity profile differing in terms of their light properties. It is thereby possible to prevent the occurrence of obtrusive interference so that obtrusive speckle patterns are largely eliminated, with the result that beam shaping quality, in particular for laser processing processes, can be considerably improved.


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