The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2022
Filed:
May. 11, 2017
Hitachi, Ltd., Tokyo, JP;
National University Corporation Hokkaido University, Sapporo, JP;
Yusuke Fujii, Sapporo, JP;
Naoki Miyamoto, Sapporo, JP;
Kikuo Umegaki, Sapporo, JP;
Shinichi Shimizu, Sapporo, JP;
Toru Umekawa, Tokyo, JP;
Takahiro Yamada, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
NATIONAL UNIVERSITY CORPORATION HOKKAIDO UNIVERSITY, Sapporo, JP;
Abstract
A template matching is performed on two fluoroscopic images by using a template image prepared in advance and a position corresponding to a high matching score is listed as a candidate for the position of a marker. From two lists of the candidates of the position of the marker, the lengths of common vertical lines for all combinations are calculated. Then, the position of the markeris detected based on the matching score and the common vertical line. Then, based on the detected position of the marker, an amount of a proton beam to be irradiated to a target is controlled. Therefore, a tracking target can be accurately detected even when the conditions for X-ray fluoroscopy is severe, e.g., a thick object.