The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Sep. 10, 2019
Applicant:

Lento Medical Inc., Houston, TX (US);

Inventor:

Ilwhan Park, Walnut Creek, CA (US);

Assignee:

LENTO MEDICAL, INC., Houston, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 34/10 (2016.01); A61B 17/15 (2006.01); G16H 30/40 (2018.01); G16H 20/40 (2018.01); A61B 5/00 (2006.01); A61B 17/56 (2006.01);
U.S. Cl.
CPC ...
A61B 34/10 (2016.02); A61B 5/4528 (2013.01); A61B 17/155 (2013.01); A61B 17/157 (2013.01); G16H 20/40 (2018.01); G16H 30/40 (2018.01); A61B 2017/564 (2013.01); A61B 2034/102 (2016.02); A61B 2034/105 (2016.02); A61B 2034/108 (2016.02);
Abstract

A computer-aided pre-operative planning tool with interactive surgeon interface for total knee replacement implements a method that allows implant size selection, implant positioning, and surgical cut planes estimation (with construction of corresponding surgical jig), based upon a series of coronal, axial and sagittal image slices of a patient's leg. Limb alignment and corresponding surgical cut planes are defined based upon joint anatomical-matching analysis to minimize joint wear and restore a pre-arthritic alignment (rather than an always fully neutral alignment). Using the interface, a surgeon has the option to adjust the varus/valgus alignment within recommended bounds between the pre-arthritic and fully neutral alignments. Implant size may be selected based on a best fit to the patient's leg obtained from analysis of the images.


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