The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Aug. 07, 2020
Applicant:

Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);

Inventors:

Jeffrey L. Jew, Brookline, NH (US);

Michael A. Costolo, Amherst, NH (US);

Adam O. Powers, Manchester, NH (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
H04N 5/33 (2013.01); H01L 27/14649 (2013.01);
Abstract

Systems for detecting a presence of a microbolometer are provided. The systems may also discriminate a type of the microbolometer. The systems may comprise analog filtering and processing or digital filtering and processing. In some examples, both analog and digital filtering may be used. For example, a system may comprises a photodiode, an analog to digital converter (ADC) having a frequency sampling rate of at least two times an expected frequency range of known microbolometers and a processor. The ADC may receive an amplified output from the photodiode and produce a sampled sequence using the frequency sampling rate. The processor converts the sampled sequence into a frequency profile, examines the frequency profile to identity at least a fundamental frequency and determines whether a microbolometer is detected in a line of sight of the photodiode based on the fundamental frequency.


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