The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Jun. 22, 2020
Applicant:

New Relic, Inc., San Francisco, CA (US);

Inventors:

Erika Arnold, Portland, OR (US);

Michael LaSpina, Portland, OR (US);

Todd West, Portland, OR (US);

Assignee:

New Relic, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); H04L 12/26 (2006.01); H04L 41/14 (2022.01); H04L 43/02 (2022.01); H04L 43/10 (2022.01);
U.S. Cl.
CPC ...
H04L 41/14 (2013.01); H04L 43/02 (2013.01); H04L 43/10 (2013.01);
Abstract

A system provides for tail-based sampling of span data at the trace level. The system may include a circuitry, such as one or more servers, that execute applications, agents, and a trace manager. The agents generate span data of operations performed by the applications. The trace manager receives the span data from the agents, and groups the operations defined by the span data into traces. The trace manager determines a selected subset of the traces for span data sampling and an unselected subset of the traces excluded from the span data sampling by comparing one or more trace characteristics of the traces with one or more trace criteria. The trace manager discards unselected span data of the unselected subset of the traces and provide selected span data of the selected subset of the traces to a monitoring system via a network.


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