The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2022
Filed:
Feb. 10, 2021
Applicant:
Tsinghua University, Beijing, CN;
Inventors:
Xiao-Ping Zheng, Beijing, CN;
De-Jian Zhang, Beijing, CN;
Assignee:
TSINGHUA UNIVERSITY, Beijing, CN;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01Q 19/15 (2006.01); H01Q 13/20 (2006.01); H01Q 19/06 (2006.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
H01Q 19/15 (2013.01); G01R 29/10 (2013.01); H01Q 13/20 (2013.01); H01Q 19/062 (2013.01);
Abstract
The present application provides a terahertz leaky-wave antenna measuring system in which an original feed enclosed by a structure is replaced with a probe. The probe is moved along grooves in different directions to acquire amplitude and phase information in real-time to achieve an antenna equivalent measurement according to the reciprocity theorem, wherein the feed and the structure are separated from each other.
Zheng, Xiao-Ping. (2022). Terahertz leaky-wave antenna measuring system (U.S. Patent No. 11437729). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11437729
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile