The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Aug. 06, 2020
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Atsugi, JP;

Inventors:

Kenichi Okazaki, Tochigi, JP;

Toshinari Sasaki, Shinagawa, JP;

Shuhei Yokoyama, Tochigi, JP;

Takashi Hamochi, Shimotsuga, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 29/24 (2006.01); H01L 21/385 (2006.01); H01L 29/786 (2006.01); H01L 29/66 (2006.01); H01L 29/49 (2006.01); H01L 23/31 (2006.01); H01L 29/04 (2006.01); H01L 29/45 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7869 (2013.01); H01L 21/02112 (2013.01); H01L 21/02274 (2013.01); H01L 21/385 (2013.01); H01L 23/3171 (2013.01); H01L 29/045 (2013.01); H01L 29/24 (2013.01); H01L 29/45 (2013.01); H01L 29/4908 (2013.01); H01L 29/4966 (2013.01); H01L 29/66742 (2013.01); H01L 29/66969 (2013.01); H01L 29/78606 (2013.01); H01L 29/78648 (2013.01); H01L 29/78696 (2013.01);
Abstract

In a semiconductor device including a transistor including an oxide semiconductor film and a protective film over the transistor, an oxide insulating film containing oxygen in excess of the stoichiometric composition is formed as the protective film under the following conditions: a substrate placed in a treatment chamber evacuated to a vacuum level is held at a temperature higher than or equal to 180° C. and lower than or equal to 260° C.; a source gas is introduced into the treatment chamber so that the pressure in the treatment chamber is set to be higher than or equal to 100 Pa and lower than or equal to 250 Pa; and a high-frequency power higher than or equal to 0.17 W/cmand lower than or equal to 0.5 W/cmis supplied to an electrode provided in the treatment chamber.


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