The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Jun. 26, 2019
Applicant:

Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;

Inventor:

Peng Cheng, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); A61N 5/10 (2006.01); H01J 49/20 (2006.01); H01J 49/44 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0027 (2013.01); A61N 5/1065 (2013.01); H01J 49/20 (2013.01); A61N 2005/1089 (2013.01); H01J 49/44 (2013.01);
Abstract

The present disclosure discloses a method and a system for determining an energy spectrum of an incident electron beam. The method includes obtaining a plurality of deflection currents of a beam deflection device; for each of the plurality of deflection currents, determining an energy range of an ejected electron beam, and determining a target current of a target generated by the ejected electron beam irradiating the target, wherein the ejected electron beam is emitted from an output of the beam deflection device after the incident electron beam enters the beam deflection device. The method also includes determining the energy spectrum of the incident electron beam based on the energy ranges of the plurality of ejected electron beams and the corresponding target currents.


Find Patent Forward Citations

Cheng, Peng. (2022). Method and system for determining energy spectrum of x-ray device (U.S. Patent No. 11437225). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11437225

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