The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Nov. 15, 2019
Applicant:

Instarecon, Inc., Urbana, IL (US);

Inventors:

Ashvin K George, Golden, CO (US);

Jeffrey Brokish, Savoy, IL (US);

Yoram Bresler, Urbana, IL (US);

Assignee:

InstaRecon, Urbana, IL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/006 (2013.01);
Abstract

Methods and systems for computed tomography provide advances in efficiency. The methods operating within the parallel-beam geometry, rather than a divergent beam geometry, for the majority of the operations. In back projection methods perform digital image coordinate transformations on selected intermediate-images, the parameters of one or more coordinate transformations being chosen such that Fourier spectral support of the intermediate-image is modified so that a region of interest has an increased extent along one or more coordinate direction and the aggregates of the intermediate-images can be represented with a desired accuracy by sparse samples. Forward projection methods perform digital image coordinate transformations on an input image to produce multiple intermediate-images, the parameters of one or more coordinate transformations being chosen such that Fourier spectral support of an intermediate-image being produced is modified so that a region of interest has a reduced extent along one or more coordinate direction and the intermediate-images can be represented with a desired accuracy by sparse samples.


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