The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2022
Filed:
Jun. 06, 2019
Sf Technology Co., Ltd., Shenzhen, CN;
HuiQuan Liu, Shenzhen, CN;
SF TECHNOLOGY CO., LTD., Shenzhen, CN;
Abstract
The present patent application relates to a volume measurement method and system, an apparatus and a computer-readable storage medium. The method comprises: collecting a first information of a measurement area when there is no object to be measured and a first depth image information of the measurement area when there is an object to be measured under a current viewing angle based on a 3D vision system located above the measurement area; identifying an outer contour of the object to be measured by comparing gray values of the first information and the first depth image information collected under different viewing angles to obtain a first depth information of the outer contour of the object to be measured, and filling in an area defined by the outer contour of the object to be measured to obtain a target of object to be measured and size information of the target of object to be measured; performing block division on an outer contour area of the object to be measured according to a preset relationship between the first depth information and divided blocks to generate block information; and obtaining a volume of the object to be measured according to a preset relationship among the block information, the size information of the target of object to be measured, and a volume of the object to be measured. According to the method, measurement is performed based on 3D vision, and the objects to be measured are directly measured, so the measurement speed is fast, the measurement accuracy is high, and the measurement range is large.