The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2022
Filed:
Dec. 27, 2019
Applicant:
Shanghai United Imaging Intelligence Co., Ltd., Shanghai, CN;
Inventors:
Zaiwen Gong, Shanghai, CN;
Hengze Zhan, Shanghai, CN;
Jie-Zhi Cheng, Shanghai, CN;
Yiqiang Zhan, Shanghai, CN;
Jibing Wu, Shanghai, CN;
Xiang Sean Zhou, Shanghai, CN;
Assignee:
SHANGHAI UNITED IMAGING INTELLIGENCE CO., LTD., Shanghai, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06N 20/00 (2019.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); A61B 5/0033 (2013.01); G06N 20/00 (2019.01); G06T 7/11 (2017.01); A61B 2576/023 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30048 (2013.01); G06T 2207/30061 (2013.01); G06T 2207/30168 (2013.01);
Abstract
The present disclosure may provide a method. The method may include processing an image of a subject using a detection model to generate one or more detection results corresponding to one or more objects in the image; and generating an image metric of the image based on the one or more detection results corresponding to the one or more objects.