The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Mar. 08, 2019
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

Holger M. Jaenisch, Toney, AL (US);

James W. Handley, Toney, AL (US);

Guy G. Swope, Reston, VA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/20 (2019.01); G06N 5/04 (2006.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06N 20/20 (2019.01); G06K 9/628 (2013.01); G06N 5/043 (2013.01);
Abstract

A method can include determining a cell of a grid to which a first feature and a second feature of each of a plurality of input/output examples maps, determining an average of respective features of the cell to generate respective level 2 synthetic feature vectors, for each cell with an input/output example of the input/output examples mapped thereto, generating a sub-grid of cells and map the input/output examples mapped to a cell of the sub-grid, determining an average of respective features to generate respective level 1 synthetic feature vectors comprising the average of the respective features, training the ML technique using the level 2 synthetic feature vector, testing the trained ML technique using the level 1 synthetic feature vector of each sub-cell, and further testing the trained ML technique using the input/output examples to generate a class and confidence for each of the input/output examples.


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