The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Aug. 16, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Haoyu Wang, Somerville, MA (US);

Ming Tan, Malden, MA (US);

Dakuo Wang, Cambridge, MA (US);

Chuang Gan, Cambridge, MA (US);

Saloni Potdar, Arlington, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 7/00 (2006.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/285 (2019.01); G06N 7/005 (2013.01);
Abstract

A method includes determining, based on an input data sample, a set of probabilities. Each probability of the set of probabilities is associated with a respective label of a set of labels. A particular probability associated with a particular label indicates an estimated likelihood that the input data sample is associated with the particular label. The method includes modifying the set of probabilities based on a set of adjustment factors to generate a modified set of probabilities. The set of adjustment factors is based on a first relative frequency distribution and a second relative frequency distribution. The first relative frequency distribution indicates for each label of the set of labels, a frequency of occurrence of the label among training data. The second relative frequency distribution indicates for each label of the set of labels, a frequency of occurrence of the label among post-training data provided to the trained classifier.


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