The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2022
Filed:
Jun. 16, 2021
Fujifilm Business Innovation Corp., Tokyo, JP;
Yosuke Tashiro, Kanagawa, JP;
FUJIFILM Business Innovation Corp., Tokyo, JP;
Abstract
An inspection device includes a processor configured to use, as correct image data, read image data obtained by reading an image-formed matter obtained by forming original image data on a recording medium, and, in a case where a first inspection of determining quality of read image data as an inspection target is performed using the correct image data, the read image data being obtained by reading a new image-formed matter, perform a second inspection on a blank portion or a solid portion included in the read image data as the inspection target, the second inspection using the original image data as the correct image data.