The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Dec. 06, 2019
Applicant:

Palo Alto Research Center Incorporated, Palo Alto, CA (US);

Inventors:

Shantanu Rane, Menlo Park, CA (US);

Alejandro E. Brito, Mountain View, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06K 9/62 (2022.01); G06F 17/18 (2006.01); G06N 20/10 (2019.01);
U.S. Cl.
CPC ...
G06K 9/6269 (2013.01); G06F 17/18 (2013.01); G06K 9/6259 (2013.01); G06N 20/10 (2019.01);
Abstract

The system determines a version space associated with a set of data comprising a pool of unlabeled samples and a first plurality of labeled samples, wherein the version space includes a first set of classifiers corresponding to the first plurality of labeled samples. The system selects, from the pool of unlabeled samples, a second plurality of unlabeled samples comprising informative samples and non-informative samples. A respective informative sample corresponds to a first hyperplane which intersects the version space, and a respective non-informative sample corresponds to a second hyperplane which does not intersect the version space. The system acquires labels corresponding to the second plurality of unlabeled samples to obtain a third plurality of labeled samples. The system updates the first set of classifiers based on the third plurality of labeled samples, thereby improving accuracy of the first set of classifiers.


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