The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2022
Filed:
Jun. 05, 2018
Sightline Innovation Inc., Toronto, CA;
Wallace Trenholm, Toronto, CA;
Mark Alexiuk, Winnipeg, CA;
Hieu Dang, Winnipeg, CA;
Siavash Malektaji, Winnipeg, CA;
Kamal Darchinimaragheh, Winnipeg, CA;
Other;
Abstract
A method and system for increasing data quality of a dataset for semi-supervised machine learning analysis. The method includes: receiving known class label information for a portion of the data in the dataset; receiving clustering parameters from a user; determining a data cleanliness factor, and where the data cleanliness factor is below a predetermined cleanliness threshold: assigning data without class label information as a data point to a cluster using the clustering parameters, each cluster having a cluster class label associated with such cluster; and determining a measure of assignment, and where the measure of assignment for each data point is below a predetermined assignment threshold, receiving a class label for such data points, otherwise, assigning the respective cluster class label to each data point with the respective measure of assignment below the predetermined assignment threshold; and otherwise, outputting the dataset with associated class labels for machine learning analysis.