The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2022
Filed:
Mar. 16, 2020
International Business Machines Corporation, Armonk, NY (US);
Andrew C. M. Hicks, Wappingers Falls, NY (US);
Ryan Thomas Rawlins, New Paltz, NY (US);
Dale E. Blue, Poughkeepsie, NY (US);
Jacob Thomas Snyder, New Fairfield, CT (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method for testing a system under test (SUT) in an active environment to identify cause of a soft failure includes recording a first difference vector by executing a set of test cases on a baseline system and monitoring performance parameters of the baseline system before and after executing the test cases. Each performance record represents differences in the performance parameters of the baseline system from before and after the execution of a corresponding test case. The method further includes, similarly, recording a second difference vector by executing the test cases on the SUT and monitoring performance parameters of the SUT before and after executing the test cases. The method further includes identifying an outlier performance record from the second difference vector by comparing the difference vectors and further, determining a root cause of the soft failure by analyzing a test case corresponding to the outlier.