The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2022
Filed:
May. 14, 2020
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventor:
Nobuyuki Muranaka, San Jose, CA (US);
Assignee:
HITACHI, LTD., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/05 (2006.01);
U.S. Cl.
CPC ...
G05B 19/05 (2013.01); G05B 2219/15038 (2013.01);
Abstract
Example implementations described herein are directed to a change over detection system and method. Such example implementations facilitate updating the information of the production line in an Internet of Things (IoT) system to the latest version. Through the example implementations described herein, device rearrangement in manufacturing field can thereby be detected.
Muranaka, Nobuyuki. (2022). System and method for detecting change over in manufacturing field (U.S. Patent No. 11435715). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11435715
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