The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Oct. 22, 2020
Applicant:

Takashi Yasui, Tokyo, JP;

Inventor:

Takashi Yasui, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/00 (2006.01); G01R 33/035 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0356 (2013.01); G01R 33/0358 (2013.01);
Abstract

A magnetic field measuring apparatus includes a digital FLL circuit. The digital FLL circuit includes a first amplifier configured to amplify voltage output by a superconducting quantum interference device in accordance with strength of a magnetic field strength, an AD converter configured to, convert analog signals to first digital values, an integrator configured to integrate the first digital values output by the AD converter, a DA converter configured to receive an integral value output by the integrator as a second digital value, convert the second digital value to voltage, and output the converted voltage, a signal switcher configured to connect an output of the first amplifier or an output of the DA converter to an input of the AD converter, and a storage unit configured to store a correction value that corrects the integral value received by the DA converter.


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