The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Apr. 16, 2020
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Kazuki Takahashi, Kawasaki, JP;

Akiko Matsui, Meguro, JP;

Kohei Choraku, Yokohama, JP;

Mitsunori Abe, Kawasaki, JP;

Tetsuro Yamada, Kawasaki, JP;

Yoshio Kobayashi, Saitama, JP;

Sotaro Kobayashi, Saitama, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
G01R 27/2623 (2013.01);
Abstract

A specific conductivity measurement method includes: performing first measurement to obtain a resonance frequency fthat is outputted to a measuring device when the first and second dielectric flat plates each have a thickness t, and an unloaded Qthat corresponds to the resonance frequency f; performing second measurement to obtain a resonance frequency fthat is outputted to the measuring device when the first and second dielectric flat plates each have a thickness tthat is different from the thickness t, and an unloaded Qthat corresponds to the resonance frequency f; and calculating a specific conductivity σof the copper foil and the first and second conductor flat plates based on an arithmetic equation that includes the resonance frequency the unloaded Q, the resonance frequency f, and the unloaded Q.


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