The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2022
Filed:
Nov. 09, 2017
Shimadzu Corporation, Kyoto, JP;
Yoshihiro Yamada, Kyoto, JP;
Koretsugu Ogata, Kyoto, JP;
Hiroto Tamura, Kani, JP;
Teruyo Kato, Aisai, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
A sample group forming sectionclassifies samples derived from microorganisms into groups according to empirical information showing the species or strain of each sample. A differential analysis sectionperforms a differential analysis using a peak matrix created based on the result of the grouping. An operator enters group rearrangement conditions concerning the drug resistance of microorganisms. Under the entered conditions, a sample group rearranging/rearrangement-cancelling sectionrearranges the already formed groups by selecting or merging groups using another kind of previously registered empirical information which shows the drug resistance of each group. The differential analysis sectionperforms a differential analysis using a peak matrix newly created based on the result of the rearrangement of the groups. Thus, differential analysis results concerning the resistance to different drugs can be sequentially acquired as the group rearrangement condition is successively changed.