The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Jun. 25, 2018
Applicant:

National Institute of Advanced Industrial Science and Technology, Tokyo, JP;

Inventors:

Takao Ueda, Ibaraki, JP;

Tatsuya Oki, Ibaraki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/24 (2006.01); G06F 17/18 (2006.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G01N 33/24 (2013.01); G06F 17/18 (2013.01); G06K 9/6277 (2013.01);
Abstract

To give reliability to statistical data on samples as discrete materials, a required sample-number determination device includes: a required sample number for each class acquisition unit configured to acquire a required sample number for each class Nby the following Equation (1) based on a proportion P{circumflex over ( )}, that is a ratio of the number of samples in each class to the number of the samples in the population; a temporary required sample number acquisition unit configured to acquire a temporary required sample number N, which may be a maximum value among the required sample numbers for each class N; and a required sample number determination unit configured to determine the temporary required sample number Nas a true required sample number when the sample number reaches the temporary required sample number Nor more, in Equation (1), ξdenotes a constant for accuracy that is set for each class, Kis a constant depending on set reliability, and i as indices denotes a class number assigned to each class.


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