The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Mar. 13, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Tan Azuma, Tokyo, JP;

Yusuke Kikuchi, Tokyo, JP;

Kousuke Ishida, Tokyo, JP;

Shunsuke Akimoto, Tokyo, JP;

Kenichiro Fujiyama, Tokyo, JP;

Shinji Oominato, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/12 (2006.01); G01N 29/44 (2006.01); G01N 33/00 (2006.01); A01G 7/00 (2006.01);
U.S. Cl.
CPC ...
G01N 29/12 (2013.01); G01N 29/4436 (2013.01); G01N 33/0098 (2013.01); A01G 7/00 (2013.01);
Abstract

A plant monitoring apparatusincludes: an extraction unitthat extracts a feature amount in a frequency response of vibration of a target plant with use of the vibration; a calculation unitthat calculates a change that indicates growth of the plant, based on the extracted feature amount and a reference feature amount that corresponds to a reference state of the plant; and an estimation unitthat estimates a state of the plant by, with use of the calculated change, referencing state information in which changes of the feature amount from the reference feature amount corresponding to growth of the plant are associated with states of the plant.


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