The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Nov. 12, 2019
Applicant:

The Trustees of Princeton University, Princeton, NJ (US);

Inventors:

Adrian A. Wanner, Princeton, NJ (US);

David Tank, Princeton, NJ (US);

Sebastian Seung, Princeton, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/2251 (2018.01); G01N 23/046 (2018.01); A61B 6/03 (2006.01); G01N 1/30 (2006.01); G01N 1/31 (2006.01); G01N 23/225 (2018.01); G01N 13/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2251 (2013.01); A61B 6/035 (2013.01); G01N 1/30 (2013.01); G01N 23/046 (2013.01); G01N 1/31 (2013.01); G01N 13/00 (2013.01); G01N 23/225 (2013.01); G01N 2013/003 (2013.01); G01N 2223/419 (2013.01); G01N 2223/6126 (2013.01);
Abstract

Disclosed are a procedure and system for live monitoring of staining quality and heavy metal diffusion during electron microscopy preparation protocols for biological samples. The disclosed approach employs x-rays via, e.g., a commercially available micro-CT device, to observe and measure the diffusion and distribution of the heavy metals during conventional biological sample staining procedures for electron microscopy. This allows one to observe and check the quality and homogeneity of the staining without damaging or destroying the sample.


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