The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2022
Filed:
Jan. 02, 2020
Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;
Boe Technology Group Co., Ltd., Beijing, CN;
Hongzhen Xue, Beijing, CN;
Fuqiang Ma, Beijing, CN;
Yali Liu, Beijing, CN;
Lili Chen, Beijing, CN;
Jiankang Sun, Beijing, CN;
Shuo Zhang, Beijing, CN;
BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Beijing, CN;
BEIJING BOE TECHNOLOGY DEVELOPMENT CO., LTD., Beijing, CN;
Abstract
An optical distortion measurement method that including receiving target field of view information; processing the target field of view information using a coordinate conversion model to obtain screen coordinates of a target angle of view, wherein the coordinate conversion model may be configured to convert image plane coordinates of the target angle of view to screen coordinates of the target angle of view; and outputting at least the screen coordinates of the target angle of view.