The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Jan. 02, 2020
Applicants:

Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;

Boe Technology Group Co., Ltd., Beijing, CN;

Inventors:

Hongzhen Xue, Beijing, CN;

Fuqiang Ma, Beijing, CN;

Yali Liu, Beijing, CN;

Lili Chen, Beijing, CN;

Jiankang Sun, Beijing, CN;

Shuo Zhang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/66 (2006.01); G01M 11/02 (2006.01); G01N 21/88 (2006.01); H04N 9/31 (2006.01); G02B 27/01 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/66 (2013.01); G01M 11/02 (2013.01); G01N 21/8851 (2013.01); H04N 9/3191 (2013.01); G01N 2021/8887 (2013.01); G02B 27/0172 (2013.01); G02B 2027/014 (2013.01);
Abstract

An optical distortion measurement method that including receiving target field of view information; processing the target field of view information using a coordinate conversion model to obtain screen coordinates of a target angle of view, wherein the coordinate conversion model may be configured to convert image plane coordinates of the target angle of view to screen coordinates of the target angle of view; and outputting at least the screen coordinates of the target angle of view.


Find Patent Forward Citations

Xue, Hongzhen. (2022). Optical distortion measuring apparatus and optical distortion measuring method, image processing system, electronic apparatus and display apparatus (U.S. Patent No. 11435289). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11435289

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…