The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2022
Filed:
Mar. 26, 2019
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventors:
Assignee:
FUJIFILM CORPORATION, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/04 (2006.01); G01N 27/72 (2006.01); G01N 33/50 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/04 (2013.01); G01N 27/72 (2013.01); G01N 33/5005 (2013.01); G01N 2015/0042 (2013.01);
Abstract
Provided is a medium evaluation method for evaluating the suitability of a medium in which cell aggregates are cultured in a suspended state, by which an evaluation of whether a medium is adequate for both the cell retention performance and the cell recovery efficiency, the medium evaluation method including dispersing a plurality of particles in a medium, measuring a sedimentation velocity by which the particles settle in the medium, and using the sedimentation velocity thus measured as an index value indicating the suitability of the medium; and also provided are a medium and a culture method.