The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2022
Filed:
Jun. 07, 2018
Tsinghua University, Beijing, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Jun Zhu, Beijing, CN;
Xiao-Fei Wu, Beijing, CN;
Yu-Ting Deng, Beijing, CN;
Guo-Fan Jin, Beijing, CN;
Shou-Shan Fan, Beijing, CN;
Tsinghua University, Beijing, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A method for analyzing distribution of tolerances on a freeform surface in an optical system. Establishes a freeform surface imaging optical system. A plurality of fields is selected, and maximum and minimum margins of wavefront errors in each field are defined. One freeform surface in one field is selected, an isolated point jumping model is established, and an isolated point is placed in different areas of the freeform surface of the one field. A local figure error with extreme values corresponding to each field is resolved, based on the maximum and minimum margins of wavefront errors, and the local surface tolerance distributions of the freeform surface in the plurality of fields are integrated together.