The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Sep. 13, 2017
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Hideaki Numata, Tokyo, JP;

Hiroyuki Endoh, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 25/00 (2006.01); G01L 1/22 (2006.01); G11C 13/00 (2006.01);
U.S. Cl.
CPC ...
G01L 25/00 (2013.01); G01L 1/2268 (2013.01); G01L 1/2287 (2013.01); G11C 13/003 (2013.01); G11C 13/004 (2013.01);
Abstract

A control apparatus controls an array-type sensor. The control apparatus includes: a first selector/driver that is configured to select and drive one of a plurality of first lines; a second selector/driver that is configured to select and drive at least one of a plurality of second lines; a read/arithmetic circuit that is configured to read outputs of respective unit cells and perform a correction operation on the outputs; and a nonvolatile storage device that is configured to store reference data. The sensor outputs of the respective unit cells with respect to two or more reference inputs are stored as reference data in the nonvolatile storage device in a calibration mode, and a correction operation is performed on the sensor outputs of the respective unit cells using the stored reference data and results of the correction operation are output in a measurement mode.


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