The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2022
Filed:
Sep. 14, 2021
Quantum Valley Ideas Laboratories, Waterloo, CA;
James Keaveney, Waterloo, CA;
Geoffrey Gordon Gillett, Waterloo, CA;
James P. Shaffer, Kitchener, CA;
Quantum Valley Ideas Laboratories, Waterloo, CA;
Abstract
In a general aspect, a method is presented for increasing the measurement precision of an optical instrument. The method includes determining, based on optical data and environmental data, a measured value of an optical property measured by the optical instrument. The optical instrument includes an optical path and a sensor configured to measure an environmental parameter. The method also includes determining a predicted value of the optical property based on a model representing time evolution of the optical instrument. The method additionally includes calculating an effective value of the optical property based on the measured value, the predicted value, and a Kalman gain. The Kalman gain is based on respective uncertainties in the measured and predicted values and defines a relative weighting of the measured and predicted values in the effective value.