The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2022
Filed:
May. 03, 2019
Korea Research Institute of Standards and Science, Daejeon, KR;
Kee-Suk Hong, Daejeon, KR;
Dong-Hoon Lee, Daejeon, KR;
Seongchong Park, Daejeon, KR;
Jisoo Hwang, Daejeon, KR;
Korea Research Institute of Standards and Science, Daejeon, KR;
Abstract
Provided are an apparatus and method for measuring quantum efficiency of a detector using a single pulse laser. Quantum efficiency of the measurement target detector may be measured from 420 nm to 1600 nm having uncertainty of 2% to 4% (K=2) by comparing the reference detector and the measurement target detector significantly different in sensitivity using a single laser pulse as a spectral light source. Also, it is possible to directly compare the two detectors with a significant difference in sensitivity through a very simple setup that causes a portion of a laser pulse output from a light source part to be absorbed by the reference detector and the laser pulse reflected from the reference detector to be irradiated to the measurement target detector.