The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

May. 15, 2020
Applicant:

Endress+hauser Group Services Ag, Reinach, CH;

Inventor:

Dimitri Vaissiere, Rixheim, FR;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/66 (2022.01); G01K 13/00 (2021.01); G01K 15/00 (2006.01); G01N 27/416 (2006.01); G01F 25/10 (2022.01);
U.S. Cl.
CPC ...
G01F 1/662 (2013.01); G01F 25/10 (2022.01); G01K 13/00 (2013.01); G01K 15/005 (2013.01); G01N 27/4163 (2013.01); G01N 27/4167 (2013.01);
Abstract

A method for monitoring a measurement variable and performing predictive monitoring of a compliancy of a characteristic of a field device to a requirement is described. The method includes a step of determining a deviation between a measured value of a monitored variable and a reference value of the monitored variable. The deviation is indicative of a degree of compliancy to the requirement. The method also includes a step of applying a filter to the deviations based on the deviations and the filtered deviations. The method further includes a step of determining a noise superimposed on the filtered deviations. At the end of a monitoring interval, a time remaining until the deviations will exceed the deviation range is determined using a Monte Carlo simulation.


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