The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Feb. 17, 2022
Applicant:

M & H Inprocess Messtechnik Gmbh, Waldburg, DE;

Inventor:

Christoph Wiest, Weingarten, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/008 (2006.01); G01B 21/04 (2006.01);
U.S. Cl.
CPC ...
G01B 21/042 (2013.01);
Abstract

A device for calibrating the speed of a movement axis of a machine, including a measuring instrument and a measuring assembly having first and second measuring elements provided at a defined and known distance from one another on the measuring assembly. The measuring assembly is arranged on a workpiece receptacle of the machine, and the measuring instrument performs measurements with a known target frequency. When the device is arranged on the machine and the measuring instrument is moved at a known target speed of a movement axis of the machine from the first measuring element to the second measuring element, the measuring instrument interacts with the respective measuring element to determine an interaction date or a detection date. The device detects starting from the first interaction date or detection date to the second interaction date or detection date, a number of measurements of the measuring instrument.


Find Patent Forward Citations

Wiest, Christoph. (2022). Device for calibrating a speed of an axis of motion of a machine (U.S. Patent No. 11435179). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11435179

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…