The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2022

Filed:

Jun. 02, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Hiroshi Takigawa, Yamanashi, JP;

Tadashi Kurosawa, Yamanashi, JP;

Hisatada Machida, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2018.01); B23K 26/064 (2014.01); G05B 19/18 (2006.01); G06N 20/00 (2019.01); G05B 15/02 (2006.01); G05B 19/4065 (2006.01);
U.S. Cl.
CPC ...
B23K 26/064 (2015.10); G05B 15/02 (2013.01); G05B 19/182 (2013.01); G05B 19/4065 (2013.01); G06N 20/00 (2019.01); G05B 2219/45154 (2013.01);
Abstract

The laser machining system includes a laser device configured to output a laser beam, and a machining head configured to emit the laser beam emitted by a laser oscillator of the laser device and propagated through an optical fiber, to a workpiece in order to perform laser machining. The machining head includes at least one wavelength selective mirror having wavelength selectivity with various values of reflectivity and transmittance according to wavelengths, and at least one image capturing device. The laser machining system monitors abnormality in a laser optical system leading from the laser oscillator to the machining head, during the laser machining, by reflecting light propagated from a side of introduction of the laser beam into the machining head by the wavelength selective mirror, making the light incident on an image capturing surface of the image capturing device, and detecting incident light illuminance distribution appearing on the image capturing surface of the image capturing device.


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