The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2022
Filed:
Feb. 01, 2021
Fujifilm Corporation, Tokyo, JP;
Yasufumi Oda, Kanagawa, JP;
FUJIFILM CORPORATION, Tokyo, JP;
Abstract
At least two first offset images having different accumulation times are acquired in a state in which radiation is not emitted. A pixel signal is read in an accumulation time shorter than that of a plurality of first offset images or using binning reading in a state in which the radiation is not emitted to acquire a second offset image. A reference image is acquired by reading the pixel signal using the same reading method as that used for the second offset image and in a state in which gates of the pixels are turned off. A difference between the two first offset images having different accumulation times is calculated to acquire a first dark current distribution image. A difference between the second offset image and the reference image is calculated to acquire a second dark current distribution image. It is determined whether or not reacquisition is needed on the basis of a correction error of a corrected image obtained by correcting the first dark current distribution image on the basis of the second dark current distribution image.