The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2022
Filed:
Sep. 28, 2017
Lenovo (Beijing) Limited, Beijing, CN;
Jing Han, Beijing, CN;
Lianhai Wu, Beijing, CN;
Haiming Wang, Beijing, CN;
Zhuoyun Zhang, Beijing, CN;
Lenovo (Beijing) Limited, Beijing, CN;
Abstract
A method of measurement report enhancement for aerial UE. A method of measurement report enhancement, the method comprising: receiving a measurement report configuration with a new measurement triggering condition and corresponding threshold from eNB; performing measurements of a cells according to the new measurement triggering condition; evaluating if a new triggering condition is satisfied according to the threshold based on the measurement result of cells; and reporting the measurement report to the eNB when the new triggering condition is satisfied.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile