The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Feb. 26, 2020
Applicant:

Sony Group Corporation, Tokyo, JP;

Inventors:

Noriaki Takahashi, Tokyo, JP;

Haruka Mitsumori, Tokyo, JP;

Yuto Kobayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/31 (2006.01); H04N 5/247 (2006.01); H04N 17/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
H04N 9/3194 (2013.01); G06T 7/0002 (2013.01); H04N 5/247 (2013.01); H04N 9/3185 (2013.01); H04N 17/002 (2013.01); G06T 2207/30168 (2013.01);
Abstract

The present technology relates to an image processing apparatus, an image processing method, and a program that allow an improvement in measurement accuracy by taking into account degradation occurring during projection and degradation occurring during imaging. An image processing apparatus according to an aspect of the present technology performs, on a test pattern image representing a predetermined test pattern, correction according to an imaging degradation model obtained by modeling degradation occurring during capturing of the test pattern image projected on a screen, and correction according to a projection degradation model obtained by modeling degradation occurring during projection of the test pattern image. The present technology can be applied to an image processing apparatus that controls projection by a projector.


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