The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Jan. 06, 2020
Applicant:

Raytheon Company, Waltham, MA (US);

Inventor:

Lacy G. Cook, El Segundo, CA (US);

Assignee:

RAYTHEON COMPANY, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/30 (2006.01);
U.S. Cl.
CPC ...
H04N 5/30 (2013.01);
Abstract

A millimeter-wave optical imaging system including an imaging detector located at a focal plane of the optical imaging system, the imaging detector being responsive to electromagnetic radiation in wavelength range of approximately 5-50 millimeters, an immersion lens directly coupled to the imaging detector and configured to focus the electromagnetic radiation onto the imaging detector, wherein the focal plane is located on a planar surface of the immersion lens and the imaging detector is directly coupled to the planar surface, a positive power primary mirror configured to reflect the electromagnetic radiation towards the immersion lens, and one of a Fresnel lens or a diffraction grating configured to receive and direct the electromagnetic radiation towards the primary mirror.


Find Patent Forward Citations

Loading…