The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Dec. 16, 2020
Applicant:

Schweitzer Engineering Laboratories, Inc., Pullman, WA (US);

Inventors:

Glenn C. Bethmann, Pullman, WA (US);

Mauricio G. Silveira, Pullman, WA (US);

Stephanie L. McDaid, Kennewick, WA (US);

Andrew W. Rash, Pullman, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 43/50 (2022.01); H04L 43/0852 (2022.01); H04L 43/0817 (2022.01); H04L 43/0882 (2022.01);
U.S. Cl.
CPC ...
H04L 43/50 (2013.01); H04L 43/0817 (2013.01); H04L 43/0852 (2013.01); H04L 43/0882 (2013.01);
Abstract

The present disclosure relates to systems and methods for testing communication systems. In one embodiment, a communication device tester may include a traffic disciplining subsystem to generate a first stream of data packets satisfying a metric and may communicate the first stream of data packets to a test device in a first test scenario. A delay subsystem may generate a variable delay in a second stream of data packets and communicate the second stream of data packets to the test device in a second test scenario. A data corruption subsystem may corrupt a third stream of data packets and communicate the third stream of data packets to the test device in a third test scenario. A test subsystem may determine whether the test device satisfies at least one criterion of each of the first test scenario, the second test scenario, and the third test scenario.


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