The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Feb. 12, 2021
Applicant:

Hach Company, Loveland, CO (US);

Inventors:

Vishnu Vardhanan Rajasekharan, Fort Collins, CO (US);

Russell Young, Fort Collins, CO (US);

Assignee:

HACH COMPANY, Loveland, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 43/065 (2022.01); G06Q 10/00 (2012.01); H04L 41/0681 (2022.01); G01F 23/2962 (2022.01); G01F 1/05 (2006.01); G01F 15/075 (2006.01);
U.S. Cl.
CPC ...
H04L 43/065 (2013.01); G06Q 10/20 (2013.01); H04L 41/0681 (2013.01); G01F 1/05 (2013.01); G01F 15/0755 (2013.01); G01F 23/2962 (2013.01);
Abstract

An embodiment provides a method for real-time management of device maintenance utilizing quality metrics defined based upon inputs of the device, the method including: receiving inputs corresponding to a particular device, wherein the particular device provides measurements of a parameter of a fluid; generating, from the inputs, quality metrics for and unique to the particular device; monitoring the particular device while the particular device is deployed, wherein the monitoring occurs in view of the quality metrics; and triggering, responsive to detecting information corresponding to the particular device is violating at least one of the quality metrics, a notification to a user to perform an action corresponding to the particular device.


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