The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Jun. 11, 2019
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Yung-Ching Tseng, Milpitas, CA (US);

Jian-Feng Guo, Dalian, CN;

Ying Guo, ChongQing, CN;

Xiang Guan, ChongQing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); H04L 41/0893 (2022.01); G06F 11/07 (2006.01); H04L 43/045 (2022.01); H04L 41/22 (2022.01); H04L 41/0677 (2022.01); H04L 41/0686 (2022.01); H04L 41/0853 (2022.01); H04L 41/14 (2022.01);
U.S. Cl.
CPC ...
H04L 41/0893 (2013.01); G06F 11/0709 (2013.01); G06F 11/079 (2013.01); G06F 11/0751 (2013.01); H04L 41/0677 (2013.01); H04L 41/0686 (2013.01); H04L 41/0853 (2013.01); H04L 41/145 (2013.01); H04L 41/22 (2013.01); H04L 43/045 (2013.01);
Abstract

Configuration management of devices from multiple vendors using a hardware abstraction capability is provided. Abstraction between a high-level representation and vendor specific terminology may assist in translating configuration commands and operational status indicators to a single consistent presentation interface. Information may be obtained from computer devices to represent operational metrics of a corporate network infrastructure. Collected metrics may be translated for consistency across vendors. Similarly, configuration commands may initially be provided without regard to vendor specific syntax. Utilizing the high-level abstracted representation, a user interface representation of operational status (without regard to vendor terminology) may be provided for a heterogenous rack of associated components from at least two different vendors. Collected data may be analyzed to provide predicted failure of components. Predicted failures may be further analyzed to provide a damage radius representative of potential impact caused by a predicted failure if that failure were to actually take place.


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