The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Jul. 14, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Taisoo Lim, Seoul, KR;

Kyungwook Park, Daegu, KR;

Wangyup Ryu, Busan, KR;

Keun Lee, Seongnam-si, KR;

Changwoo Lee, Suwon-si, KR;

Hauk Han, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 16/08 (2006.01); H01L 21/3205 (2006.01); H01L 21/285 (2006.01); H01L 21/673 (2006.01); C23C 16/455 (2006.01);
U.S. Cl.
CPC ...
H01L 21/32051 (2013.01); H01L 21/28556 (2013.01); H01L 21/67346 (2013.01); C23C 16/08 (2013.01); C23C 16/45525 (2013.01);
Abstract

A method of manufacturing a semiconductor device may include forming a stack structure by alternately stacking sacrificial layers and interlayer insulating layers on a substrate, forming channel structures extending through the stack structure, forming openings extending through the stack structure, forming lateral openings by removing the sacrificial layers exposed by the openings, and forming gate electrodes in the lateral openings. Forming the gate electrodes may include supplying a source gas containing tungsten (W) wherein the source gas is heated to a first temperature and is supplied in a deposition apparatus at the first temperature, supplying a reactant gas containing hydrogen (H) subsequently to supplying the source gas, wherein the reactant gas is heated to a second temperature and is supplied in the deposition apparatus at the second temperature, and supplying a purge gas subsequently to supplying the reactant gas.


Find Patent Forward Citations

Loading…