The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2022
Filed:
Jun. 18, 2020
Applicant:
Raytheon Company, Waltham, MA (US);
Inventors:
Joseph C. Landry, Dallas, TX (US);
Thomas J. Grabow, Richardson, TX (US);
Assignee:
Raytheon Company, Waltham, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/13 (2022.01); G06V 20/10 (2022.01); G06V 10/36 (2022.01); G06V 10/60 (2022.01); G01J 3/28 (2006.01); G01J 3/42 (2006.01); G06T 5/00 (2006.01); G06T 5/20 (2006.01);
U.S. Cl.
CPC ...
G06V 20/13 (2022.01); G01J 3/2823 (2013.01); G06T 5/003 (2013.01); G06T 5/20 (2013.01); G06V 10/36 (2022.01); G06V 10/60 (2022.01); G01J 2003/2826 (2013.01); G06V 20/194 (2022.01);
Abstract
A system for estimating a Lambertian equivalent reflectance for reflective band imagery is disclosed. In some embodiments, the system estimates an equivalent reflectance and performs atmospheric correction of reflective band imagery without user interaction and accounts for the effect of background reflectance mixing with individual target reflectances. Some of these embodiments use a dark pixel-based technique to improve the characterization of the atmosphere.